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SAN: Inducing Metrizability of GAN with Discriminative Normalized Linear Layer

Yuhta Takida · Masaaki Imaizumi · Takashi Shibuya · Chieh-Hsin Lai · Toshimitsu Uesaka · Naoki Murata · Yuki Mitsufuji

Halle B #76
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Tue 7 May 1:45 a.m. PDT — 3:45 a.m. PDT

Abstract: Generative adversarial networks (GANs) learn a target probability distribution by optimizing a generator and a discriminator with minimax objectives. This paper addresses the question of whether such optimization actually provides the generator with gradients that make its distribution close to the target distribution. We derive *metrizable conditions*, sufficient conditions for the discriminator to serve as the distance between the distributions, by connecting the GAN formulation with the concept of sliced optimal transport. Furthermore, by leveraging these theoretical results, we propose a novel GAN training scheme called the Slicing Adversarial Network (SAN). With only simple modifications, a broad class of existing GANs can be converted to SANs. Experiments on synthetic and image datasets support our theoretical results and the effectiveness of SAN as compared to the usual GANs. We also apply SAN to StyleGAN-XL, which leads to a state-of-the-art FID score amongst GANs for class conditional generation on CIFAR10 and ImageNet 256$\times$256. The code is available at

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