Let OOD Feature Exploring Vast Predefined Classifiers

Real-world out-of-distribution (OOD) data exhibit broad, continually evolving distributions, rendering reliance solely on in-distribution (ID) data insufficient for robust detection. Consequently, methods leveraging auxiliary Outlier Exposure (OE) data have emerged, substantially enhancing generalization by jointly fine-tuning models on ID and large-scale OE data. However, many existing approaches primarily enforce orthogonality between ID and OE features while pushing OE predictions toward near-uniform, low-confidence scores, thus overlooking the controllability of representation geometry. We propose Vast Predefined Classifiers (VPC), which constructs a pre-specified Orthogonal Equiangular Feature Space (OEFS) to explicitly separate ID and OOD representations while capturing the rich variability of OOD features. We employ evidential priors to align ID features with their class-specific Equiangular Basic Vectors (EBVs), thereby preserving ID performance. In parallel, a new VEBV loss encourages OE features to explore the subspace spanned by Vast EBVs (VEBVs), enabling a rich characterization of diverse OOD patterns. This dual optimization, coupled with the prescribed geometric representation space, promotes optimal orthogonality between ID and OOD representations. Furthermore, we introduce the VPC Score, a discriminative metric based on the L2 activation intensity of features over the predefined classifiers. Extensive experiments across diverse OOD settings and training paradigms on benchmarks including CIFAR-10/100 and the ImageNet-1k, demonstrate strong and robust performance, validating VPC's effectiveness.