Electron-multiplying charge-coupled device (EMCCD) has been instrumental in sensitive observations under low-light situations including astronomy, material science, and biology. Despite its ingenious designs to enhance target signals overcoming read-out circuit noises, produced images are not completely noise free, which could still cast a cloud on desired experiment outcomes, especially in fluorescence microscopy.Existing studies on EMCCD's noise model have been focusing on statistical characteristics in theory, yet unable to incorporate latest advancements in the field of computational photography, where physics-based noise models are utilized to guide deep learning processes, creating adaptive denoising algorithms for ordinary image sensors.Still, those models are not directly applicable to EMCCD.In this paper, we intend to pioneer EMCCD denoising by introducing a systematic study on physics-based noise model calibration procedures for an EMCCD camera, accurately estimating statistical features of observable noise components in experiments, which are then utilized to generate substantial amount of authentic training samples for one of the most recent neural networks.A first real-world test image dataset for EMCCD is captured, containing both images of ordinary daily scenes and those of microscopic contents.Benchmarking upon the testset and authentic microscopic images, we demonstrate distinct advantages of our model against previous methods for EMCCD and physics-based noise modeling, forging a promising new path for EMCCD denoising.